China High Quality Laboratory Equipment - Teaching Atomic Force Microscope – Chengyu factory and manufacturers

High Quality Laboratory Equipment - Teaching Atomic Force Microscope – Chengyu

Specification

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The incredibly rich projects administration experiences and a person to 1 service model make the substantial importance of organization communication and our easy understanding of your expectations for Material Strength Testing, Impact Sample Cutting Machine, Carton Testing Machine, We generally hold the philosophy of win-win, and build long-term cooperation partnership with clients from throughout the earth.We believe that our growth base on customer's achievements, credit history is our lifetime.

High Quality Laboratory Equipment - Teaching Atomic Force Microscope – Chengyu Detail:

1. Miniaturized and detachable design, very easy to carry and teach

2. The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

3. Precision probe positioning device, laser spot alignment adjustment is very easy

4. The single axis drives the sample to automatically approach the probe vertically, so that the tip of the needle is scanned perpendicular to the sample

5. The intelligent needle feeding method of the motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

6. Automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

7. Spring suspension shockproof method, simple and practical, good shockproof effect

8. Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

Specifications:

Operating mode	touch mode, tap mode
Optional mode	Friction/Lateral Force, Amplitude/Phase, Magnetic/Electrostatic Force
force spectrum curve	F-Z force curve, RMS-Z curve
XY scan range	2020um, optional 5050um, 100*100um
Z scan range	2.5um, optional 5um, 10um
Scan resolution	Horizontal 0.2nm, Vertical 0.05nm
Sample size	Φ≤90mm, H≤20mm
Sample stage travel	15*15mm
Optical observation	4X optical objective lens/2.5um resolution
Scan speed	0.6Hz-30Hz
Scan angle	0-360°
Operating environment	Windows XP/7/8/10 operating system
Communication Interface	USB2.0/3.0
Shock-absorbing design	Spring Suspended

Related Product Guide:

We always do the job to be a tangible group making sure that we can provide you with the top top quality as well as ideal value for High Quality Laboratory Equipment - Teaching Atomic Force Microscope – Chengyu , The product will supply to all over the world, such as: Sierra Leone, Argentina, Seattle, Whether selecting a current product from our catalog or seeking engineering assistance for your application, you can talk to our customer service center about your sourcing requirements. We are looking forward to cooperating with friends from all over the world.

The factory workers have a good team spirit, so we received high quality products fast, in addition, the price is also appropriate, this is a very good and reliable Chinese manufacturers.