1.Integrated design of optical metallographic microscope and atomic force microscope, powerful functions
2.It has both optical microscope and atomic force microscope imaging functions, both of which can work at the same time without affecting each other
3.At the same time, it has the functions of optical two-dimensional measurement and atomic force microscope three-dimensional measurement
4. The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
5. Precision probe positioning device, laser spot alignment adjustment is very easy
6. The single-axis drive sample automatically approaches the probe vertically, so that the tip of the needle is scanned perpendicular to the sample
7. The intelligent needle feeding method of the motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
8. Ultra-high magnification optical positioning system to achieve precise positioning of probe and sample scanning area
9. Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%
Specifications:
Operating mode | touch mode, tap mode |
Optional mode | Friction/Lateral Force, Amplitude/Phase, Magnetic/Electrostatic Force |
force spectrum curve | F-Z force curve, RMS-Z curve |
XY scan range | 50*50um, optional 20*20um, 100*100um |
Z scan range | 5um, optional 2um, 10um |
Scan resolution | Horizontal 0.2nm, Vertical 0.05nm |
Sample size | Φ≤68mm, H≤20mm |
Sample stage travel | 25*25mm |
Optical eyepiece | 10X |
Optical objective | 5X/10X/20X/50X Plan Apochromatic Objectives |
Lighting method | LE Kohler Lighting System |
Optical focusing | Rough manual focus |
Camera | 5MP CMOS sensor |
display | 10.1 inch flat panel display with graph related measurement function |
Scan speed | 0.6Hz-30Hz |
Scan angle | 0-360° |
Operating environment | Windows XP/7/8/10 operating system |
Communication Interface | USB2.0/3.0 |